Lateral Profiling of Defects and Charges in Oxide Semiconductor Channel Thin-Film Transistors
작성자 관리자
날짜 2022-11-18 17:37:01
Lateral Profiling of Defects and Charges in Oxide Semiconductor Channel Thin-Film Transistors, IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, https://ieeexplore.ieee.org/document/9165227
